Please use this identifier to cite or link to this item:
Title: Experimental interference robustness evaluation of IEEE 802.15.4-2015 OQPSK-DSSS and SUN-OFDM physical layers for industrial communications
Author: Tuset Peiró, Pere  
Vázquez Gallego, Francisco
Muñoz, Jonathan
Watteyne, Thomas
Alonso Zarate, Jesús
Vilajosana i Guillén, Xavier
Others: Universitat Oberta de Catalunya. Internet Interdisciplinary Institute (IN3)
Centre Tecnològic de Telecomunicacions de Catalunya
Institut National de Recherche en Informatique et en Automatique (Inria)
Keywords: IEEE 802.15.4
smart utility networks
Issue Date: 18-Sep-2019
Publisher: Electronics
Citation: Tuset-Peiró, P., Vázquez-Gallego, F., Muñoz, J., Watteyne, T., Alonso-Zarate, J. & Vilajosana, X. (2019). Experimental interference robustness evaluation of IEEE 802.15.4-2015 OQPSK-DSSS and SUN-OFDM physical layers for industrial communications. Electronics, 8(9), 1-16. doi: 10.3390/electronics8091045
Project identifier: info:eu-repo/grantAgreement/SGR-60-2017
Also see:
Abstract: In this paper, we experimentally evaluate and compare the robustness against interference of the OQPSK-DSSS (Offset Quadrature Phase Shift Keying-Direct Sequence Spread Spectrum) and the SUN-OFDM (Smart Utility Network-Orthogonal Frequency Division Multiplexing) physical layers, as defined in the IEEE 802.15.4-2015 standard. The objective of this study is to provide a comprehensive analysis of the impact that different levels of interference produce on these modulations, in terms of the resulting PDR (Packet Delivery Ratio) and depending on the length of the packet being transmitted. The results show that the SUN-OFDM physical layer provides significant benefits compared to the ubiquitous OQPSK-DSSS in terms of interference robustness, regardless of the interference type and the packet length. Overall, this demonstrates the suitability of choosing the SUN-OFDM physical layer when deploying low-power wireless networks in industrial scenarios, especially taking into consideration the possibility of trading-off robustness and spectrum efficiency depending on the application requirements.
Language: English
ISSN: 2079-9292MIAR
Appears in Collections:Articles

Files in This Item:
File Description SizeFormat 
TusetPeiro_Electronics_Experiemental.pdf5.93 MBAdobe PDFView/Open

This item is licensed under a Creative Commons License Creative Commons